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V. Rusu, L. du Bousquet, T. Jéron. An approach to symbolic test generation. In International Conference on Integrating Formal Methods (IFM'00), LNCS 1945, Pages 338-357, November 2000.

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@InProceedings{rbj00,
   Author = {Rusu, V. and du Bousquet, L. and Jéron, T.},
   Title = {An approach to symbolic test generation},
   BookTitle = {International Conference on Integrating Formal Methods (IFM'00)},
   Pages = {338--357},
   Series = {LNCS 1945},
   Publisher = {Springer Verlag},
   Month = {November},
   Year = {2000}
}

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