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Ochre V1 Circuit : On-Chip Randomness Extraction

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Characteristics 


Technology
CMOS 130 nm, STMicroelectronics HCMOS9GP
Size
1 mm2 
Fabrication
CMP facilities (run January 2009)
Tools
front end: Synopsys Design Complier for synthesis and Mentor-Graphics ModelSim for simulation
back end: Cadence Encounter for place&route, Mentor-Graphics Calibre for Verification and Cadence Virtuoso for tape-out
(tools provided by CNFM)
Validation
Fully operational 
Designers
Renaud Santoro, Philippe Quémerais,  Thomas Anger
Contact
Olivier Sentieys

Description

The number of hardware applications requiring a hardware Random Number Generator (RNG) is continuously increasing, specially in embedded circuits (e.g. Field Programmable Gate Array (FPGA) or System-on-Chip). As a consequence, many applications need an embedded RNG with the highest quality and security level. The OCHRE V1 chip implements a hybrid RNG composed of a True Random Number Generator (TRNG) and a Pseudo Random Number Generator (PRNG). The TRNG randomness quality is monitored on real-time by hardware statistical tests. As a result, the design is able to detect TRNG weaknesses due to defects or to non-invasive attacks.

Layout

layout

Die Picture


OCHRE V1 die

Comments

A second version is under preparation.


 

Created by tisseran
Last modified 08.12.2010 08:12 AM
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14.02.2012
11:00-12:00 Logic Functions Decomposition in Reed-Muller Spectral Domain